Atomic Force Microscopy in Process Engineering. Introduction by W. Richard Bowen

By W. Richard Bowen

This is the 1st booklet to assemble either the elemental concept and confirmed procedure engineering perform of AFM. it's awarded in a manner that's obtainable and priceless to working towards engineers in addition to to those that are bettering their AFM abilities and data, and to researchers who're constructing new items and recommendations utilizing AFM.

The publication takes a rigorous and sensible strategy that guarantees it's at once acceptable to technique engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for technique engineering are basically outlined and illustrated. Key content material contains: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.

  • Atomic strength microscopy (AFM) is a vital device for procedure engineers and scientists because it permits more suitable strategies and products
  • The simply publication facing the speculation and functional purposes of atomic strength microscopy in method engineering
  • Provides best-practice counsel and event on utilizing AFM for technique and product improvement

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